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Results:
1-7
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Results: 7
Authors:
Lin, MT
Jaccodine, RJ
Delph, TJ
Citation: Mt. Lin et al., Planar oxidation of strained silicon substrates, J MATER RES, 16(3), 2001, pp. 728-733
Authors:
Cormier, J
Rickman, JM
Delph, TJ
Citation: J. Cormier et al., Stress calculation in atomistic simulations of perfect and imperfect solids (vol 89, pg 99, 2001), J APPL PHYS, 89(7), 2001, pp. 4198-4198
Authors:
Cormier, J
Rickman, JM
Delph, TJ
Citation: J. Cormier et al., Stress calculation in atomistic simulations of perfect and imperfect solids, J APPL PHYS, 89(1), 2001, pp. 99-104
Authors:
Harlow, DG
Delph, TJ
Citation: Dg. Harlow et Tj. Delph, Creep deformation and failure: Effects of randomness and scatter, J ENG MATER, 122(3), 2000, pp. 342-347
Authors:
Delph, TJ
Lin, MT
Citation: Tj. Delph et Mt. Lin, Intrinsic stress effects on the growth of planar SiO2 films, J MATER RES, 14(12), 1999, pp. 4508-4513
Authors:
Delph, TJ
Citation: Tj. Delph, A simple model for crack growth in creep resistant alloys, INT J FRACT, 98(1), 1999, pp. 77-86
Authors:
Mihalyi, A
Jaccodine, RJ
Delph, TJ
Citation: A. Mihalyi et al., Stress effects in the oxidation of planar silicon substrates, APPL PHYS L, 74(14), 1999, pp. 1981-1983
Risultati:
1-7
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