Authors: Cole, MW Hubbard, C Fountzoulas, CG Demaree, D Natarajan, A Miller, RA Zhu, D Xie, K

Citation: Mw. Cole et al., The reliability of Ni contacts to n-SiC subjected to pulsed thermal fatigue, EL SOLID ST, 2(2), 1999, pp. 97-99

Authors: Cole, MW Fountzoulas, CG Demaree, D

Citation: Mw. Cole et al., A surface science investigation of device structures exposed to high poweroperational stress, SCANNING, 21(2), 1999, pp. 79-80