Authors:
Kruger, S
Wernicke, G
Osten, W
Kayser, D
Demoli, N
Gruber, H
Citation: S. Kruger et al., Fault detection and feature analysis in interferometric fringe patterns bythe application of wavelet filters in convolution processors, J ELECTR IM, 10(1), 2001, pp. 228-233
Authors:
Wernicke, G
Bouamama, L
Kruschke, O
Demoli, N
Gruber, H
Kruger, S
Citation: G. Wernicke et al., Some investigations in holographic microscopic interferometry with respectto the estimation of stress and strain in micro-opto-electromechanical systems (MOEMS), OPT LASER E, 36(5), 2001, pp. 475-485
Authors:
Demoli, N
Hirsch, A
Kruger, S
Wernicke, G
Gruber, H
Senoner, W
Citation: N. Demoli et al., Optimization in mapping of correlation filters in a liquid crystal displaybased frequency plane correlator, OPT ENG, 38(6), 1999, pp. 1058-1064