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Results: 1-12 |
Results: 12
Large-image-format computed tomography imaging spectrometer for fluorescence microscopy
Authors: Ford, BK Descour, MR Lynch, RM
Citation: Bk. Ford et al., Large-image-format computed tomography imaging spectrometer for fluorescence microscopy, OPT EXPRESS, 9(9), 2001, pp. 444-453
UV light induced surface expansion phenomenon of hybrid glass thin films
Authors: Rantala, JT Karkkainen, AHO Hiltunen, JA Keranen, M Kololuoma, T Descour, MR
Citation: Jt. Rantala et al., UV light induced surface expansion phenomenon of hybrid glass thin films, OPT EXPRESS, 8(13), 2001, pp. 682-687
Computed tomography-based spectral imaging for fluorescence microscopy
Authors: Ford, BK Volin, CE Murphy, SM Lynch, RM Descour, MR
Citation: Bk. Ford et al., Computed tomography-based spectral imaging for fluorescence microscopy, BIOPHYS J, 80(2), 2001, pp. 986-993
Midwave-infrared snapshot imaging spectrometer
Authors: Volin, CE Garcia, JP Dereniak, EL Descour, MR Hamilton, T McMillan, R
Citation: Ce. Volin et al., Midwave-infrared snapshot imaging spectrometer, APPL OPTICS, 40(25), 2001, pp. 4501-4506
Multilayer-coating-induced aberrations in extreme-ultraviolet lithography optics
Authors: Liang, C Descour, MR Sasian, JM Lerner, SA
Citation: C. Liang et al., Multilayer-coating-induced aberrations in extreme-ultraviolet lithography optics, APPL OPTICS, 40(1), 2001, pp. 129-135
Optimization of retardance for a complete Stokes polarimeter
Authors: Sabatke, DS Descour, MR Dereniak, EL Sweatt, WC Kemme, SA Phipps, GS
Citation: Ds. Sabatke et al., Optimization of retardance for a complete Stokes polarimeter, OPTICS LETT, 25(11), 2000, pp. 802-804
Misalignment modes in high-performance optical systems
Authors: Descour, MR Willer, MR Clarke, DS Volin, CE
Citation: Mr. Descour et al., Misalignment modes in high-performance optical systems, OPT ENG, 39(7), 2000, pp. 1737-1747
Design approach and comparison of projection cameras for EUV lithography
Authors: Lerner, SA Sasian, JM Descour, MR
Citation: Sa. Lerner et al., Design approach and comparison of projection cameras for EUV lithography, OPT ENG, 39(3), 2000, pp. 792-802
Direct UV patterning of thick hybrid glass films for micro-opto-mechanicalstructures
Authors: Rantala, JT Levy, R Kivimaki, L Descour, MR
Citation: Jt. Rantala et al., Direct UV patterning of thick hybrid glass films for micro-opto-mechanicalstructures, ELECTR LETT, 36(6), 2000, pp. 530-531
Multilevel structures in sol-gel thin films with a single UV-exposure using a gray-scale mask
Authors: Ayras, P Rantala, JT Levy, R Descour, MR Honkanen, S Peyghambarian, H
Citation: P. Ayras et al., Multilevel structures in sol-gel thin films with a single UV-exposure using a gray-scale mask, THIN SOL FI, 352(1-2), 1999, pp. 9-12
Ring-toric lens for focus-error sensing in optical data storage
Authors: Descour, MR Simon, DI Yeh, WH
Citation: Mr. Descour et al., Ring-toric lens for focus-error sensing in optical data storage, APPL OPTICS, 38(8), 1999, pp. 1388-1392
Binary-phase zone-plate arrays based on hybrid solgel glass
Authors: Rantala, JT Ayras, P Levy, R Honkanen, S Descour, MR Peyghambarian, N
Citation: Jt. Rantala et al., Binary-phase zone-plate arrays based on hybrid solgel glass, OPTICS LETT, 23(24), 1998, pp. 1939-1941
Risultati: 1-12 |