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Citation: B. Capelle et al., Determination of the vibration amplitude of thickness shear modes using white beam stroboscopic topography at ESRF, ANN CHIM-SC, 26(1), 2001, pp. 29-34

Authors: Cambon, O Yot, P Balitsky, D Goiffon, A Philippot, E Capelle, B Detaint, J

Citation: O. Cambon et al., Crystal growth of GaPO4, a very promising material for manufacturing BAW devices, ANN CHIM-SC, 26(1), 2001, pp. 79-84

Authors: Detaint, J Capelle, B Cambon, O Philippot, E

Citation: J. Detaint et al., Properties of at cut gallium phosphate resonators, ANN CHIM-SC, 26(1), 2001, pp. 151-160

Authors: Yot, P Cambon, O Balitsky, D Goiffon, A Philippot, E Capelle, B Detaint, J

Citation: P. Yot et al., Advances in crystal growth and characterizations of gallium orthophosphate, GaPO4, J CRYST GR, 224(3-4), 2001, pp. 294-302

Authors: Capelle, B Detaint, J Epelboin, Y

Citation: B. Capelle et al., New contrasts of piezoelectric devices using synchrotron stroboscopic section topography at ESRF, J APPL CRYS, 34, 2001, pp. 625-629