Authors: Hugonnard-Bruyere, E Cantin, JL von Bardeleben, HJ Letertre, F DiCioccio, L Ouisse, T

Citation: E. Hugonnard-bruyere et al., Defect studies in epitaxial SiC-6H layers on insulator (SiCOI), MICROEL ENG, 48(1-4), 1999, pp. 277-280