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Results: 2
Observation of misfit dislocation strain-induced surface features for a Si/Ge-Si heterostructure using total reflection X-ray topography
Authors: McNally, PJ Dilliway, G Bonar, JM Willoughby, A Tuomi, T Rantamaki, R Danilewsky, AN Lowney, D
Citation: Pj. Mcnally et al., Observation of misfit dislocation strain-induced surface features for a Si/Ge-Si heterostructure using total reflection X-ray topography, PHYS ST S-A, 180(1), 2000, pp. R1-R3
On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure
Authors: McNally, PJ Dilliway, G Bonar, JM Willoughby, A Tuomi, T Rantamaki, R Danilewsky, AN Lowney, D
Citation: Pj. Mcnally et al., On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure, APPL PHYS L, 77(11), 2000, pp. 1644-1646
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