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Results:
1-8
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Results: 8
Authors:
Zambov, LM
Ivanov, B
Popov, C
Georgiev, G
Stoyanov, I
Dimitrov, DB
Citation: Lm. Zambov et al., Characterization of low-dielectric constant SiOCN films synthesized by lowpressure chemical vapour deposition, J PHYS IV, 11(PR3), 2001, pp. 1005-1012
Authors:
Petrov, P
Dimitrov, DB
Krastev, V
Georgiev, C
Popov, C
Citation: P. Petrov et al., X-ray photoelectron spectroscopy characterization of CNx thin films deposited by electron beam evaporation and nitrogen ion bombardment, DIAM RELAT, 9(3-6), 2000, pp. 562-565
Authors:
Dimitrov, DB
Koprinarova, J
Pazov, J
Angelov, C
Citation: Db. Dimitrov et al., Conductivity of micro-porous magnetron-sputtered thin TiO2 films, VACUUM, 58(2-3), 2000, pp. 344-350
Authors:
Dimitrov, DB
Beshkova, M
Dafinova, R
Citation: Db. Dimitrov et al., Influence of vacuum rapid thermal annealing on the properties of mu PCVD SiO2 and SiO2 center dot P2O5 films, VACUUM, 58(2-3), 2000, pp. 485-489
Authors:
Beshkov, G
Dimitrov, DB
Velchev, N
Petrov, P
Ivanov, B
Zambov, L
Dimitrova, T
Citation: G. Beshkov et al., Effect of vacuum rapid thermal annealing on the properties of SiNx films, VACUUM, 58(2-3), 2000, pp. 509-515
Authors:
Dimitrov, DB
Papadimitriou, D
Beshkov, G
Citation: Db. Dimitrov et al., Spectroscopic characterization of thin SiC films, DIAM RELAT, 8(6), 1999, pp. 1148-1151
Authors:
Beshkov, G
Dimitrov, DB
Georgiev, S
Juan-Cheng, D
Petrov, P
Velchev, N
Krastev, V
Citation: G. Beshkov et al., XPS spectra of thin CNx films prepared by chemical vapor deposition, DIAM RELAT, 8(2-5), 1999, pp. 591-594
Authors:
Petrov, P
Dimitrov, DB
Papadimitriou, D
Beshkov, G
Krastev, V
Georgiev, C
Citation: P. Petrov et al., Raman and X-ray photoelectron spectroscopy study of carbon nitride thin films, APPL SURF S, 151(3-4), 1999, pp. 233-238
Risultati:
1-8
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