Authors: Santinacci, L Djenizian, T Schmuki, P

Citation: L. Santinacci et al., Atomic force microscopy-induced nanopatterning of Si(100) surfaces, J ELCHEM SO, 148(9), 2001, pp. C640-C646

Authors: Djenizian, T Santinacci, L Schmuki, P

Citation: T. Djenizian et al., Electron-beam induced nanomasking for metal electrodeposition on semiconductor surfaces, J ELCHEM SO, 148(3), 2001, pp. C197-C202

Authors: Santinacci, L Djenizian, T Schmuki, P

Citation: L. Santinacci et al., Nanoscale patterning of Si(100) surfaces by scratching through the native oxide layer using atomic force microscope, APPL PHYS L, 79(12), 2001, pp. 1882-1884

Authors: Djenizian, T Santinacci, L Schmuki, P

Citation: T. Djenizian et al., Electron beam-induced carbon masking for electrodeposition on semiconductor surfaces, APPL PHYS L, 78(19), 2001, pp. 2940-2942

Authors: Schmuki, P Santinacci, L Djenizian, T Lockwood, DJ

Citation: P. Schmuki et al., Pore formation on n-InP, PHYS ST S-A, 182(1), 2000, pp. 51-61