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Results: 1-2 |
Results: 2
Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data
Authors: Cremona, M Mauricio, MHP Do Carmo, LCS Prioli, R Nunes, VB Zanette, SI Caride, AO Albuquerque, MP
Citation: M. Cremona et al., Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data, J MICROSC O, 197, 2000, pp. 260-267
Sputtering and coloration process in LiF thin layers induced by MeV ion bombardment
Authors: Cremona, M Pereira, JAM Mauricio, MHP Do Carmo, LCS Somma, F
Citation: M. Cremona et al., Sputtering and coloration process in LiF thin layers induced by MeV ion bombardment, RADIAT EFF, 149(1-4), 1999, pp. 215-219
Risultati: 1-2 |