ACNP - Italian Periodicals Catalogue

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Results: 1-11 |

Results: 11

Formation of porous silicon: an in situ investigation with high-resolutionX-ray diffraction

Authors: Chamard, V Pichat, C Dolino, G

Citation: V. Chamard et al., Formation of porous silicon: an in situ investigation with high-resolutionX-ray diffraction, EUR PHY J B, 21(2), 2001, pp. 185-190

Rinsing and drying studies of porous silicon by high resolution X-ray diffraction

Authors: Chamard, V Pichat, C Dolino, G

Citation: V. Chamard et al., Rinsing and drying studies of porous silicon by high resolution X-ray diffraction, SOL ST COMM, 118(3), 2001, pp. 135-139

X-ray diffraction investigation of n-type porous silicon

Authors: Chamard, V Dolino, G

Citation: V. Chamard et G. Dolino, X-ray diffraction investigation of n-type porous silicon, J APPL PHYS, 89(1), 2001, pp. 174-180

In situ X-ray diffraction investigation of porous silicon strains induced by the freezing of a confined organic fluid

Authors: Faivre, C Bellet, D Dolino, G

Citation: C. Faivre et al., In situ X-ray diffraction investigation of porous silicon strains induced by the freezing of a confined organic fluid, EUR PHY J B, 16(3), 2000, pp. 447-454

X-ray scattering study of porous silicon layers

Authors: Chamard, V Dolino, G Stettner, J

Citation: V. Chamard et al., X-ray scattering study of porous silicon layers, PHYSICA B, 283(1-3), 2000, pp. 135-138

Using direct illumination CCDs as high-resolution area detectors for X-rayscattering

Authors: Livet, F Bley, F Mainville, J Caudron, R Mochrie, SGJ Geissler, E Dolino, G Abernathy, D Grubel, G Sutton, M

Citation: F. Livet et al., Using direct illumination CCDs as high-resolution area detectors for X-rayscattering, NUCL INST A, 451(3), 2000, pp. 596-609

X-ray diffraction investigation of the low temperature thermal expansion of porous silicon

Authors: Faivre, C Bellet, D Dolino, G

Citation: C. Faivre et al., X-ray diffraction investigation of the low temperature thermal expansion of porous silicon, J APPL PHYS, 87(5), 2000, pp. 2131-2136

Phase transitions of fluids confined in porous silicon: A differential calorimetry investigation

Authors: Faivre, C Bellet, D Dolino, G

Citation: C. Faivre et al., Phase transitions of fluids confined in porous silicon: A differential calorimetry investigation, EUR PHY J B, 7(1), 1999, pp. 19-36

X-ray reflectivity investigation of thin p-type porous silicon layers

Authors: Buttard, D Dolino, G Bellet, D Baumbach, T Rieutord, F

Citation: D. Buttard et al., X-ray reflectivity investigation of thin p-type porous silicon layers, SOL ST COMM, 109(1), 1999, pp. 1-5

Porous silicon strain during in situ ultrahigh vacuum thermal annealing

Authors: Buttard, D Dolino, G Faivre, C Halimaoui, A Comin, F Formoso, V Ortega, L

Citation: D. Buttard et al., Porous silicon strain during in situ ultrahigh vacuum thermal annealing, J APPL PHYS, 85(10), 1999, pp. 7105-7111

Origin of a parasitic surface film on p(+) type porous silicon

Authors: Chamard, V Dolino, G Muller, F

Citation: V. Chamard et al., Origin of a parasitic surface film on p(+) type porous silicon, J APPL PHYS, 84(12), 1998, pp. 6659-6666

Risultati: 1-11 |