AAAAAA

   
Results: 1-3 |
Results: 3

Authors: Pfeiffer, HC Dhaliwal, RS Golladay, SD Doran, SK Gordon, MS Kendall, RA Lieberman, JE Pinckney, DJ Quickle, RJ Robinson, CF Rockrohr, JD Stickel, W Tressler, EV Tanimoto, A Yamaguchi, T Okamoto, K Suzuki, K Miura, T Okino, T Kawata, S Morita, K Suzuki, SC Shimizu, H Kojima, S Varnell, G Novak, WT Sogard, A
Citation: Hc. Pfeiffer et al., PREVAIL e-beam stepper alpha tool, MICROEL ENG, 57-8, 2001, pp. 163-172

Authors: Pfeiffer, HC Dhaliwal, RS Golladay, SD Doran, SK Gordon, MS Groves, TR Kendall, RA Lieberman, JE Petric, PF Pinckney, DJ Quickle, RJ Robinson, CF Rockrohr, JD Senesi, JJ Stickel, W Tressler, EV Tanimoto, A Yamaguchi, T Okamoto, K Suzuki, K Okino, T Kawata, S Morita, K Suziki, SC Shimizu, H Kojima, S Varnell, G Novak, WT Stumbo, DP Sogard, M
Citation: Hc. Pfeiffer et al., Projection reduction exposure with variable axis immersion lenses: Next generation lithography, J VAC SCI B, 17(6), 1999, pp. 2840-2846

Authors: Golladay, SD Kendall, RA Doran, SK
Citation: Sd. Golladay et al., High emittance source for the PREVAIL projection lithography system, J VAC SCI B, 17(6), 1999, pp. 2856-2859
Risultati: 1-3 |