Authors: Dosev, DK Puigdollers, J Orpella, A Voz, C Fonrodona, M Soler, D Marsal, LF Pallares, J Bertomeu, J Andreu, J Alcubilla, R

Citation: Dk. Dosev et al., Analysis of bias stress on thin-film transistors obtained by Hot-Wire Chemical Vapour Deposition, THIN SOL FI, 383(1-2), 2001, pp. 307-309