Authors: Mosser, V Callen, O Kobbi, F Adam, D Grattepain, C Draidia, N

Citation: V. Mosser et al., New methods for the characterization of surface states density and substrate/epilayer interface states in pseudomorphic AlGaAs/InGaAs/GaAs heterostructures, MAT SCI E B, 66(1-3), 1999, pp. 157-161