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Results:
1-7
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Results: 7
Authors:
Kolber, T
Piplits, K
Dreer, S
Mersdorf, E
Haubner, R
Hutter, H
Citation: T. Kolber et al., SIMS: a capable method for BCN quantification, APPL SURF S, 167(1-2), 2000, pp. 79-88
Authors:
Dreer, S
Wilhartitz, P
Piplits, K
Hutter, H
Kopnarski, M
Friedbacher, G
Citation: S. Dreer et al., Quantitative sputter depth profiling of silicon- and aluminium oxynitride films, MIKROCH ACT, 133(1-4), 2000, pp. 75-87
Authors:
Dreer, S
Citation: S. Dreer, Quantitative analysis of silicon- and aluminium-oxynitride films with EPMA, SIMS, hf-SNMS, hf-GD-OES and FT-IR, FRESEN J AN, 365(1-3), 1999, pp. 85-95
Authors:
Dreer, S
Krismer, R
Wilhartitz, P
Citation: S. Dreer et al., Multidimensional optimisation of process parameters by experimental designfor the deposition of aluminium and silicon oxynitride films with predictable composition, SURF COAT, 114(1), 1999, pp. 29-38
Authors:
Dreer, S
Krismer, R
Wilhartitz, P
Friedbacher, G
Citation: S. Dreer et al., Statistical evaluation of refractive index, growth rate, hardness and Young's modulus of aluminium oxynitride films, THIN SOL FI, 354(1-2), 1999, pp. 43-49
Authors:
Dreer, S
Wilhartitz, P
Mersdorf, E
Piplits, K
Friedbacher, G
Citation: S. Dreer et al., Quantitative analysis of thin aluminium-oxynitride films by EPMA, MIKROCH ACT, 131(3-4), 1999, pp. 211-218
Authors:
Dreer, S
Wilhartitz, P
Mersdorf, E
Friedbacher, G
Citation: S. Dreer et al., Quantitative analysis of silicon-oxynitride films by EPMA, MIKROCH ACT, 130(4), 1999, pp. 281-288
Risultati:
1-7
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