Authors:
Dreesen, R
Croes, K
Manca, J
De Ceuninck, W
De Schepper, L
Pergoot, A
Groeseneken, G
Citation: R. Dreesen et al., A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation, MICROEL REL, 41(3), 2001, pp. 437-443
Authors:
Temmerman, W
Vereecke, D
Dreesen, R
Van Montagu, M
Holsters, M
Goethals, K
Citation: W. Temmerman et al., Leafy gall formation is controlled by fasR, an AraC-type regulatory gene in Rhodococcus fascians, J BACT, 182(20), 2000, pp. 5832-5840
Authors:
Dreesen, R
Croes, K
Manca, J
De Ceuninck, W
De Schepper, L
Pergoot, A
Groeseneken, G
Citation: R. Dreesen et al., Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique., MICROEL REL, 39(6-7), 1999, pp. 785-790