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Authors:
Johansson, LI
Glans, PA
Wahab, Q
Grehk, TM
Eickhoff, T
Drube, W
Citation: Li. Johansson et al., Characterization of SiO2 layers thermally grown on 4H-SiC using high energy photoelectron spectroscopy, APPL SURF S, 150(1-4), 1999, pp. 137-142