Authors: Parkhutik, V Duart, JMM

Citation: V. Parkhutik et Jmm. Duart, Analysis of electrical and optical properties of silicon nanoclusters using flicker-noise spectroscopy, APPL ORGAN, 15(5), 2001, pp. 359-364

Authors: Palma, RJM Duart, JMM Riera, AMI

Citation: Rjm. Palma et al., Determination of the optical constants of tin oxide and silver thin films for their use in multilayer low-emissivity coatings., B S ESP CER, 39(4), 2000, pp. 472-475

Authors: Garcia, HV Velez, MH Garrido, OS Duart, JMM Jimenez, J

Citation: Hv. Garcia et al., CdS doped-MOR type zeolite characterization, SOL ST ELEC, 43(6), 1999, pp. 1171-1175

Authors: Palma, RJM Duart, JMM Riera, AMI

Citation: Rjm. Palma et al., Spectrally selective coatings onto architectural glasses: low-emissivity coatings, B S ESP CER, 37(1), 1998, pp. 7-12