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Results: 2
EELS characterization of TiN grown by the DC sputtering technique
Authors:
Contreras, O Duarte-Moller, A Hirata, GA Avalos-Borja, M
Citation:
O. Contreras et al., EELS characterization of TiN grown by the DC sputtering technique, J ELEC SPEC, 105(2-3), 1999, pp. 129-133
Study of different forms of carbon by analytical electron microscopy
Authors:
Duarte-Moller, A Espinosa-Magana, F Martinez-Sanchez, R Avalos-Borja, M Hirata, GA Cota-Araiza, L
Citation:
A. Duarte-moller et al., Study of different forms of carbon by analytical electron microscopy, J ELEC SPEC, 104(1-3), 1999, pp. 61-66
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