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Results: 1-7 |
Results: 7
Measurement of the (Sigma)over-bar(-) lifetime and direct comparison with the Sigma(+) lifetime - art. no. 031101
Authors: Barbosa, RF Albuquerque, IF Bondar, NF Carrigan, R Chen, D Cooper, PS Dai, LS Denisov, AS Dobrovolsky, AC Dubbs, T Endler, AMF Escobar, CO Foucher, M Golovtsov, VL Gottschalk, H Gouffon, P Grachev, VT Khanzadeev, AV Kubantsev, MA Kuropatkin, NP Lach, J Langland, J Lang, PF Li, CZ Li, YS Luksys, M Mahon, JRP McCliment, E Morelos, A Newsom, C Maia, MCP Samsonov, VM Schegelsky, VA Shi, HZ Smith, VJ Tang, FU Terentyev, NK Timm, S Tkatch, II Uvarov, LN Vorobyov, AA Jie, Y Zhao, WH Zheng, SC Zhong, YY
Citation: Rf. Barbosa et al., Measurement of the (Sigma)over-bar(-) lifetime and direct comparison with the Sigma(+) lifetime - art. no. 031101, PHYS REV D, 6103(3), 2000, pp. 1101
A comparison of the performance of irradiated p-in-n and n-in-n silicon microstrip detectors read out with fast binary electronics
Authors: Allport, PP Andricek, L Buttar, CM Carter, JR Costa, MJ Drage, LM Dubbs, T Goodrick, MJ Greenall, A Hill, JC Jones, T Moorhead, G Morgan, D O'Shea, V Phillips, PW Raine, C Riedler, P Robinson, D Saavedra, A Sadrozinski, HFW Sanchez, J Smith, NA Stapnes, S Terada, S Unno, Y
Citation: Pp. Allport et al., A comparison of the performance of irradiated p-in-n and n-in-n silicon microstrip detectors read out with fast binary electronics, NUCL INST A, 450(2-3), 2000, pp. 297-306
Design and performance of the ABCD chip for the binary readout of silicon strip detectors in the ATLAS Semiconductor Tracker
Authors: Dabrowski, W Anghinolfi, F Buttar, C Cindro, V Clark, AG Dawson, I Dorfan, D Dubbs, T Falconer, N French, M Greenall, A Grillo, AA Happer, R Jarron, P Kaplon, J Kudlaty, J Kramberger, G Lacasta, C LaMarra, D Macina, D Mandic, I Mikuz, M Meddeler, G Milgrome, O Niggli, H Phillips, PW Roe, S Smith, A Spieler, H Spencer, E Szczygiel, R Weilhammer, P Wolter, M Zsenei, A
Citation: W. Dabrowski et al., Design and performance of the ABCD chip for the binary readout of silicon strip detectors in the ATLAS Semiconductor Tracker, IEEE NUCL S, 47(6), 2000, pp. 1843-1850
Voltages on silicon microstrip detectors in high radiation fields
Authors: Dubbs, T Harms, M Sadrozinski, HFW Seiden, A Wilson, M
Citation: T. Dubbs et al., Voltages on silicon microstrip detectors in high radiation fields, IEEE NUCL S, 47(6), 2000, pp. 1902-1906
Measurement of dose rate dependence of radiation induced damage to the current gain in bipolar transistors
Authors: Dorfan, D Dubbs, T Grillo, AA Ipe, NE Mao, S Rowe, W Sadrozinski, HFW Seiden, A Spencer, E Stromberg, S Wichmann, R
Citation: D. Dorfan et al., Measurement of dose rate dependence of radiation induced damage to the current gain in bipolar transistors, IEEE NUCL S, 46(6), 1999, pp. 1884-1890
Depletion voltage and charge collection for highly irradiated silicon microstrip detectors with various initial resistivities
Authors: Cannara, R Dezillie, B Dubbs, T Hancock, J Kroeger, W Li, Z Nissen, T Onodera, M Rowe, WA Sadrozinski, HFW Wan, QS Zhao, LJ
Citation: R. Cannara et al., Depletion voltage and charge collection for highly irradiated silicon microstrip detectors with various initial resistivities, IEEE NUCL S, 46(6), 1999, pp. 1964-1968
Development of radiation-hard materials for microstrip detectors
Authors: Dubbs, T Kroeger, W Nissen, T Pulliam, T Roberts, D Rowe, WA Sadrozinski, HFW Seiden, A Thomas, B Webster, A Alers, G
Citation: T. Dubbs et al., Development of radiation-hard materials for microstrip detectors, IEEE NUCL S, 46(4), 1999, pp. 839-843
Risultati: 1-7 |