Authors: Narahari, Y Sudarsan, R Lyons, KW Duffey, MR Sriram, RD

Citation: Y. Narahari et al., Design for tolerance of electro-mechanical assemblies: An integrated approach, IEEE ROBOT, 15(6), 1999, pp. 1062-1079

Authors: van Dorp, JR Duffey, MR

Citation: Jr. Van Dorp et Mr. Duffey, Statistical dependence in risk analysis for project networks using Monte Carlo methods, INT J PRO E, 58(1), 1999, pp. 17-29