Authors: Latif, A Booij, WE Durrell, JH Blamire, MG

Citation: A. Latif et al., Real time resistometric depth monitoring in the focused ion beam, J VAC SCI B, 18(2), 2000, pp. 761-764

Authors: Durrell, JH Gibson, G Barber, ZH Evetts, JE Rossler, R Pedarnig, JD Bauerle, D

Citation: Jh. Durrell et al., Dependence of critical current on field angle in off-c-axis grown Bi2Sr2CaCu2O8 film, APPL PHYS L, 77(11), 2000, pp. 1686-1688

Authors: Durrell, JH Herzog, R Berghuis, P Bramley, AP Tarte, EJ Barber, ZH Evetts, JE

Citation: Jh. Durrell et al., Determination of pinning forces on vortex lines in YBa2Cu3O7-delta, SUPERCOND S, 12(12), 1999, pp. 1090-1093

Authors: Blamire, MG Teo, BS Durrell, JH Mathur, ND Barber, ZH Driscoll, JLM Cohen, LF Evetts, JE

Citation: Mg. Blamire et al., Strain-induced time-dependent magnetic disorder in ultra-thin La0.7Ca0.3MnO3 films, J MAGN MAGN, 191(3), 1999, pp. 359-367