AAAAAA

   
Results: 1-8 |
Results: 8
CHARACTERIZATION OF CDTE-CL CRYSTALS GROWN UNDER MICROGRAVITY CONDITIONS BY TIME-DEPENDENT CHARGE MEASUREMENTS (TDCM)
Authors: EICHE C JOERGER W FIEDERLE M EBLING D SALK M SCHWARZ R BENZ KW
Citation: C. Eiche et al., CHARACTERIZATION OF CDTE-CL CRYSTALS GROWN UNDER MICROGRAVITY CONDITIONS BY TIME-DEPENDENT CHARGE MEASUREMENTS (TDCM), Journal of crystal growth, 166(1-4), 1996, pp. 245-250
CHARACTERIZATION OF TI AND V DOPED CDTE BY TIME-DEPENDENT CHARGE MEASUREMENT (TDCM) AND PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS)
Authors: EICHE C JOERGER W FIEDERLE M EBLING D SCHWARZ R BENZ KW
Citation: C. Eiche et al., CHARACTERIZATION OF TI AND V DOPED CDTE BY TIME-DEPENDENT CHARGE MEASUREMENT (TDCM) AND PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS), Optical materials, 4(2-3), 1995, pp. 214-218
STRUCTURAL AND SPECTROSCOPIC STUDIES ON TRIMORPHOUS MENH(3)GECL(3)
Authors: SERR BR HECKERT G ROTTER HW THIELE G EBLING D
Citation: Br. Serr et al., STRUCTURAL AND SPECTROSCOPIC STUDIES ON TRIMORPHOUS MENH(3)GECL(3), Journal of molecular structure, 348, 1995, pp. 95-98
INVESTIGATION OF CDTE-CL GROWN FROM THE VAPOR-PHASE UNDER MICROGRAVITY CONDITIONS WITH TIME-DEPENDENT CHARGE MEASUREMENTS AND PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY
Authors: EICHE C JOERGER W FIEDERLE M EBLING D SCHWARZ R BENZ KW
Citation: C. Eiche et al., INVESTIGATION OF CDTE-CL GROWN FROM THE VAPOR-PHASE UNDER MICROGRAVITY CONDITIONS WITH TIME-DEPENDENT CHARGE MEASUREMENTS AND PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY, Journal of crystal growth, 146(1-4), 1995, pp. 98-103
STUDIES OF THE COMPENSATION MECHANISM IN CDTE GROWN FROM THE VAPOR-PHASE
Authors: FIEDERLE M EBLING D EICHE C HUG P JOERGER W LAASCH M SCHWARZ R SALK M BENZ KW
Citation: M. Fiederle et al., STUDIES OF THE COMPENSATION MECHANISM IN CDTE GROWN FROM THE VAPOR-PHASE, Journal of crystal growth, 146(1-4), 1995, pp. 142-147
HIGH-RESOLUTION METHOD FOR THE ANALYSIS OF ADMITTANCE SPECTROSCOPY DATA
Authors: MAIER D HUG P FIEDERLE M EICHE C EBLING D WEESE J
Citation: D. Maier et al., HIGH-RESOLUTION METHOD FOR THE ANALYSIS OF ADMITTANCE SPECTROSCOPY DATA, Journal of applied physics, 77(8), 1995, pp. 3851-3857
APPLICATIONS OF SCANNING ULTRA MICRO ELECTRODES FOR STUDIES ON SURFACE CONDUCTIVITY
Authors: BORGWARTH K EBLING D HEINZE J
Citation: K. Borgwarth et al., APPLICATIONS OF SCANNING ULTRA MICRO ELECTRODES FOR STUDIES ON SURFACE CONDUCTIVITY, Electrochimica acta, 40(10), 1995, pp. 1455-1460
COMPARISON OF CDTE, CD0.9ZN0.1TE AND CDTE0.9SE0.1 CRYSTALS - APPLICATION FOR GAMMA-RAY AND X-RAY-DETECTORS
Authors: FIEDERLE M EBLING D EICHE C HOFMANN DM SALK M STADLER W BENZ KW MEYER BK
Citation: M. Fiederle et al., COMPARISON OF CDTE, CD0.9ZN0.1TE AND CDTE0.9SE0.1 CRYSTALS - APPLICATION FOR GAMMA-RAY AND X-RAY-DETECTORS, Journal of crystal growth, 138(1-4), 1994, pp. 529-533
Risultati: 1-8 |