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Results: 1-11 |
Results: 11
POTENTIOSTATIC OXIDE FORMATION ON LEAD SELENIDE SINGLE-CRYSTALS IN ALKALINE-SOLUTIONS
Authors: MEINCKE H EBLING DG HEINZE J TACKE M BOTTNER H
Citation: H. Meincke et al., POTENTIOSTATIC OXIDE FORMATION ON LEAD SELENIDE SINGLE-CRYSTALS IN ALKALINE-SOLUTIONS, Journal of the Electrochemical Society, 145(8), 1998, pp. 2806-2812
EPR OF FE-57(3+) AND CONDUCTIVITY IN RUS2
Authors: SCHULER M SIEBERT D EBLING DG
Citation: M. Schuler et al., EPR OF FE-57(3+) AND CONDUCTIVITY IN RUS2, Applied physics A: Materials science & processing, 64(2), 1997, pp. 203-206
AN IMPROVED ANALYSIS OF ADMITTANCE DATA FOR HIGH-RESISTIVITY MATERIALS BY A NONLINEAR REGULARIZATION METHOD
Authors: WINTERHALTER J EBLING DG MAIER D HONERKAMP J
Citation: J. Winterhalter et al., AN IMPROVED ANALYSIS OF ADMITTANCE DATA FOR HIGH-RESISTIVITY MATERIALS BY A NONLINEAR REGULARIZATION METHOD, Journal of applied physics, 82(11), 1997, pp. 5488-5495
SCANNING ELECTROCHEMICAL MICROSCOPY - STUDY OF SILVER DEPOSITION ON NONCONDUCTING SUBSTRATES
Authors: HESS C BORGWARTH K RICKEN C EBLING DG HEINZE J
Citation: C. Hess et al., SCANNING ELECTROCHEMICAL MICROSCOPY - STUDY OF SILVER DEPOSITION ON NONCONDUCTING SUBSTRATES, Electrochimica acta, 42(20-22), 1997, pp. 3065-3073
INVESTIGATION OF THE COMPENSATION MECHANISM IN SEMIINSULATING GAAS FROM ALPHA-SPECTRA STUDIES AT LOW-TEMPERATURE
Authors: CHEN JW EBLING DG GEPPERT R IRSIGLER R SCHMID T ROGALLA M LUDWIG J RUNGE K
Citation: Jw. Chen et al., INVESTIGATION OF THE COMPENSATION MECHANISM IN SEMIINSULATING GAAS FROM ALPHA-SPECTRA STUDIES AT LOW-TEMPERATURE, Applied physics letters, 70(20), 1997, pp. 2693-2695
SURFACE-ANALYSIS BY SCANNING ELECTROCHEMICAL MICROSCOPY - RESOLUTION STUDIES AND APPLICATIONS TO POLYMER SAMPLES
Authors: BORGWARTH K RICKEN C EBLING DG HEINZE J
Citation: K. Borgwarth et al., SURFACE-ANALYSIS BY SCANNING ELECTROCHEMICAL MICROSCOPY - RESOLUTION STUDIES AND APPLICATIONS TO POLYMER SAMPLES, Fresenius' journal of analytical chemistry, 356(3-4), 1996, pp. 288-294
CHARACTERIZATION OF CDTE0.9SE0.1-CL STRIP DETECTORS
Authors: FIEDERLE M ROGALLA M JOERGER C SALK M EBLING DG LUDWIG J RUNGE K BENZ KW
Citation: M. Fiederle et al., CHARACTERIZATION OF CDTE0.9SE0.1-CL STRIP DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 380(1-2), 1996, pp. 153-156
RADIATION DETECTOR PROPERTIES OF CDTE0.9SE0.1 CL CRYSTALS GROWN UNDERMICROGRAVITY IN A ROTATING MAGNETIC-FIELD/
Authors: FIEDERLE M EICHE C JOERGER W SALK M SENCHENKOV AS EGOROV AV EBLING DG BENZ KW
Citation: M. Fiederle et al., RADIATION DETECTOR PROPERTIES OF CDTE0.9SE0.1 CL CRYSTALS GROWN UNDERMICROGRAVITY IN A ROTATING MAGNETIC-FIELD/, Journal of crystal growth, 166(1-4), 1996, pp. 256-260
EVALUATION OF ACTIVE LAYER PROPERTIES AND CHARGE COLLECTION EFFICIENCY OF GAAS PARTICLE DETECTORS
Authors: CHEN JW FROMMICHEN T LUDWIG J KOHLER M PLOTZE T ROGALLA M RUNGE K EBLING DG FIEDERLE M HUG P
Citation: Jw. Chen et al., EVALUATION OF ACTIVE LAYER PROPERTIES AND CHARGE COLLECTION EFFICIENCY OF GAAS PARTICLE DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 365(2-3), 1995, pp. 273-284
SURFACE CHARACTERIZATION AND MODIFICATION BY THE SCANNING ELECTROCHEMICAL MICROSCOPE (SECM)
Authors: BORGWARTH K RICKEN C EBLING DG HEINZE J
Citation: K. Borgwarth et al., SURFACE CHARACTERIZATION AND MODIFICATION BY THE SCANNING ELECTROCHEMICAL MICROSCOPE (SECM), Berichte der Bunsengesellschaft fur Physikalische Chemie, 99(11), 1995, pp. 1421-1426
SCANNING ELECTROCHEMICAL MICROSCOPY - A NEW SCANNING-MODE BASED ON CONVECTIVE EFFECTS
Authors: BORGWARTH K EBLING DG HEINZE J
Citation: K. Borgwarth et al., SCANNING ELECTROCHEMICAL MICROSCOPY - A NEW SCANNING-MODE BASED ON CONVECTIVE EFFECTS, Berichte der Bunsengesellschaft fur Physikalische Chemie, 98(10), 1994, pp. 1317-1321
Risultati: 1-11 |