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Results:
1-12
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Results: 12
Authors:
MULLER J
EIBL O
FISCHER B
HERZOG P
Citation: J. Muller et al., BI(PB)-2223 PHASE-FORMATION IN AG-SHEATHED TAPES - THE ROLE OF OXYGENPARTIAL-PRESSURE DURING SINTERING, Superconductor science and technology, 11(2), 1998, pp. 238-243
Authors:
ALEKSA M
PONGRATZ P
EIBL O
SAUERZOPF FM
WEBER HW
LI TW
KES PH
Citation: M. Aleksa et al., TEM OBSERVATION OF NEUTRON-INDUCED COLLISION CASCADES IN BI-2212 SINGLE-CRYSTALS, Physica. C, Superconductivity, 297(3-4), 1998, pp. 171-175
Authors:
EIBL O
Citation: O. Eibl, ELECTRON SPECTROSCOPIC IMAGING OF (BI,PB)(2)SR2CAN-1CUNO4-T-C SUPERCONDUCTING PHASES IN THE TEM(2N+DELTA HIGH), Ultramicroscopy, 69(4), 1997, pp. 289-296
Authors:
SCHUSTER T
KUHN H
WEISSHARDT A
KRONMULLER H
ROAS B
EIBL O
LEGHISSA M
NEUMULLER HW
Citation: T. Schuster et al., CURRENT CAPABILITY OF FILAMENTS DEPENDING ON THEIR POSITION IN (BI,PB)(2)SR2CA2CU3O10-MULTIFILAMENT TAPES(DELTA), Applied physics letters, 69(13), 1996, pp. 1954-1956
Authors:
EIBL O
Citation: O. Eibl, CRYSTAL-STRUCTURE, CHEMICAL-COMPOSITION, AND EXTENDED DEFECTS OF THE HIGH-T-C (BI,PB)(2)SR2CAN-1CUNO(4+2N+DELTA) COMPOUNDS, Microscopy research and technique, 30(3), 1995, pp. 218-245
Authors:
EIBL O
Citation: O. Eibl, THE HIGH-T-C COMPOUND (BI,PB)(2)SR2CA2CU3O10- FEATURES OF THE STRUCTURE AND MICROSTRUCTURE RELEVANT FOR DEVICES IN MAGNET AND ENERGY TECHNOLOGY(DELTA ), Superconductor science and technology, 8(12), 1995, pp. 833-861
Authors:
PRUSSEIT W
UTZ B
CORSEPIUS S
BAUDENBACHER F
HIRATA K
BERBERICH P
KINDER H
EIBL O
Citation: W. Prusseit et al., YBA2CU3O7-DELTA FILMS ON GAAS WITH HIGH CRITICAL CURRENT DENSITIES, Journal of alloys and compounds, 195(1-2), 1993, pp. 215-217
Authors:
BARDAL A
EIBL O
Citation: A. Bardal et O. Eibl, THE INTERFACIAL ATOMIC-STRUCTURE OF EPITAXIAL YBCO THIN-FILMS ON Y2O3, Physica. C, Superconductivity, 216(3-4), 1993, pp. 365-381
Authors:
BARDAL A
EIBL O
MATTHEE T
FRIEDL G
WECKER J
Citation: A. Bardal et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY OF EPITAXIAL YBCO Y2O3/YSZ ON SI(001)/, Journal of materials research, 8(9), 1993, pp. 2112-2127
Authors:
EIBL O
Citation: O. Eibl, NEW METHOD FOR ABSORPTION CORRECTION IN HIGH-ACCURACY, QUANTITATIVE EDX MICROANALYSIS IN THE TEM INCLUDING LOW-ENERGY X-RAY-LINES, Ultramicroscopy, 50(2), 1993, pp. 179-188
Authors:
EIBL O
Citation: O. Eibl, APPLICATION OF A NEW METHOD FOR ABSORPTION CORRECTION IN HIGH-ACCURACY, QUANTITATIVE EDX MICROANALYSIS IN THE TEM - ANALYSIS OF OXYGEN IN CUO-BASED HIGH-TC SUPERCONDUCTORS, Ultramicroscopy, 50(2), 1993, pp. 189-201
Authors:
EIBL O
Citation: O. Eibl, IMPROVED, PARAMETERLESS, CONSTANT-CURRENT METHOD FOR ABSORPTION CORRECTION IN QUANTITATIVE EDX MICROANALYSIS IN THE TEM, Ultramicroscopy, 50(2), 1993, pp. 203-205
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