Authors: IONESCU AM CRISTOLOVEANU S MUNTEANU D ELEWA T GRI M

Citation: Am. Ionescu et al., A NEW LIFETIME CHARACTERIZATION TECHNIQUE USING DRAIN CURRENT TRANSIENTS IN SOI MATERIAL, Solid-state electronics, 39(12), 1996, pp. 1753-1755

Authors: CRISTOLOVEANU S ELEWA T

Citation: S. Cristoloveanu et T. Elewa, MODEL FOR CARRIER LIFETIME EXTRACTION FROM PSEUDO-MOSFET TRANSIENTS, Electronics Letters, 32(21), 1996, pp. 2021-2023