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Authors: ELRHARBI S JOURDAIN M

Citation: S. Elrharbi et M. Jourdain, INFLUENCE OF THE OXIDE CHARGE BUILDUP DURING FOWLER-NORDHEIM STRESS ON THE CURRENT-VOLTAGE CHARACTERISTICS OF METAL-OXIDE-SEMICONDUCTOR CAPACITORS, Journal of non-crystalline solids, 187, 1995, pp. 175-180

Authors: ELRHARBI S JOURDAIN M MEINERTZHAGEN A ELHDIY A PETIT C

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Authors: ELRHARBI S JOURDAIN M MEINERTZHAGEN A

Citation: S. Elrharbi et al., EFFECT OF TUNNELING ELECTRONS IN FOWLER-NORDHEIM REGIME ON THE CURRENT-VOLTAGE CHARACTERISTICS AND MODEL OF DEGRADATION OF METAL-OXIDE-SEMICONDUCTOR CAPACITORS, Journal of applied physics, 76(2), 1994, pp. 1013-1020