Authors:
SOBOLEV NA
GUSEV OB
SHEK EI
VDOVIN VI
YUGOVA TG
EMELYANOV AM
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Citation: Am. Emelyanov et Vv. Golubev, INFLUENCE OF ANNEALING IN HYDROGEN AND IONIZING-RADIATION ON THE ELECTROPHYSICAL PARAMETERS OF THE SI-SIO2 INTERFACES - EXPERIMENT AND MODEL, Semiconductors, 28(12), 1994, pp. 1148-1152