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Results:
1-8
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Results: 8
Authors:
THOMANN AL
BRAULT P
LAURE C
ROUSSEAU B
ESTRADESZWARCKOPF H
ANDREAZZAVIGNOLLE C
ANDREAZZA P
NAUDON A
Citation: Al. Thomann et al., PLASMA-ASSISTED DEPOSITION OF PD THIN-FILMS, Surface & coatings technology, 98(1-3), 1998, pp. 1228-1232
Authors:
THOMANN AL
BRAULT P
ROZENBAUM JP
ANDREAZZAVIGNOLLE C
ANDREAZZA P
ESTRADESZWARCKOPF H
ROUSSEAU B
BABONNEAU D
BLONDIAUX G
Citation: Al. Thomann et al., CHEMICAL AND MORPHOLOGICAL CHARACTERIZATION OF PD AGGREGATES GROWN BYPLASMA SPUTTER-DEPOSITION, Journal of physics. D, Applied physics, 30(23), 1997, pp. 3197-3202
Authors:
LAURE C
BRAULT P
THOMMAN AL
BOSWELL R
ROUSSEAU B
ESTRADESZWARCKOPF H
Citation: C. Laure et al., PLASMA-ASSISTED EVAPORATION OF PALLADIUM, Plasma sources science & technology, 5(3), 1996, pp. 510-513
Authors:
ROUSSEAU B
VAYERBESANCON M
ESTRADESZWARCKOPF H
Citation: B. Rousseau et al., XPS AND UPS STUDY OF THE OXIDATION OF A STAGE-1 CS-GRAPHITE INTERCALATION COMPOUND - COMPARISON WITH ALKALI FILMS DEPOSITED ON SUBSTRATES, Solid state communications, 99(3), 1996, pp. 143-147
Authors:
ANNABIBERGAYA F
ESTRADESZWARCKOPF H
VANDAMME H
Citation: F. Annabibergaya et al., DEHYDRATION OF CU-HECTORITE - WATER ISOTHERM, XRD, AND EPR STUDIES, Journal of physical chemistry, 100(10), 1996, pp. 4120-4126
Authors:
VAYERBESANCON M
ROUSSEAU B
ESTRADESZWARCKOPF H
Citation: M. Vayerbesancon et al., OXYGEN-ADSORPTION ON CESIUM-GRAPHITE INTERCALATION COMPOUNDS - PHOTOEMISSION-STUDIES OF THE DAMAGES CAUSED BY X-RAY-IRRADIATION AT 100 K, Surface science, 336(1-2), 1995, pp. 741-745
Authors:
VAYERBESANCON M
ROUSSEAU B
ESTRADESZWARCKOPF H
Citation: M. Vayerbesancon et al., OXYGEN-ADSORPTION ON CS-GRAPHITE INTERCALATION COMPOUNDS UV AND X-RAYPHOTOELECTRON STUDIES ON CSC8 AT 100-K - FORMATION OF OXIDE, PEROXIDEAND SUPEROXIDE ON THE SURFACE, Surface science, 318(1-2), 1994, pp. 169-176
Authors:
ROUSSEAU B
ESTRADESZWARCKOPF H
Citation: B. Rousseau et H. Estradeszwarckopf, EVOLUTION OF K-GRAPHITE, RB-GRAPHITE AND CS-GRAPHITE INTERCALATION COMPOUNDS SURFACES UNDER CONTROLLED OXIDIZATION - AN XPS STUDY, Solid state communications, 88(1), 1993, pp. 1-4
Risultati:
1-8
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