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Results: 1-7 |
Results: 7

Authors: Eisenmenger, J Leiderer, P Wallenhorst, M Dotsch, H
Citation: J. Eisenmenger et al., Influence of microscopic defects in type-II superconducting thin films on the magnetic flux penetration - art. no. 104503, PHYS REV B, 6410(10), 2001, pp. 4503

Authors: Runge, BU Bolz, U Boneberg, J Bujok, V Brull, P Eisenmenger, J Schiessling, J Leiderer, P
Citation: Bu. Runge et al., Magneto-optic characterization of defects and study of flux avalanches in high-T-c superconductors down to nanosecond time resolution, LASER PHYS, 10(1), 2000, pp. 53-59

Authors: Runge, BU Bolz, U Eisenmenger, J Leiderer, P
Citation: Bu. Runge et al., Ultrafast magneto-optical study of flux avalanches in high-T-c superconductors, PHYSICA C, 341, 2000, pp. 2029-2030

Authors: Bolz, U Eisenmenger, J Schiessling, J Runge, BU Leiderer, P
Citation: U. Bolz et al., Magnetic instability in YBa2Cu3O7-delta films, PHYSICA B, 284, 2000, pp. 757-758

Authors: Eisenmenger, J Schiessling, J Bolz, U Runge, BU Leiderer, P Lorenz, M Hochmuth, H Wallenhorst, M Dotsch, H
Citation: J. Eisenmenger et al., Nondestructive magneto-optical characterization of natural and artificial defects on 3 '' HTSC wafers at liquid nitrogen temperature, IEEE APPL S, 9(2), 1999, pp. 1840-1843

Authors: Kuhn, M Schey, B Biegel, W Stritzker, B Eisenmenger, J Leiderer, P Heismann, B Kramer, HP Neumuller, HW
Citation: M. Kuhn et al., Defect visualization in large area YBCO thin films by magneto-optical scanning technique, IEEE APPL S, 9(2), 1999, pp. 1844-1847

Authors: Kuhn, M Schey, B Biegel, W Stritzker, B Eisenmenger, J Leiderer, P
Citation: M. Kuhn et al., Large area magneto-optical investigations of YBCO thin films, REV SCI INS, 70(3), 1999, pp. 1761-1766
Risultati: 1-7 |