Authors:
Eisenmenger, J
Leiderer, P
Wallenhorst, M
Dotsch, H
Citation: J. Eisenmenger et al., Influence of microscopic defects in type-II superconducting thin films on the magnetic flux penetration - art. no. 104503, PHYS REV B, 6410(10), 2001, pp. 4503
Authors:
Runge, BU
Bolz, U
Boneberg, J
Bujok, V
Brull, P
Eisenmenger, J
Schiessling, J
Leiderer, P
Citation: Bu. Runge et al., Magneto-optic characterization of defects and study of flux avalanches in high-T-c superconductors down to nanosecond time resolution, LASER PHYS, 10(1), 2000, pp. 53-59
Authors:
Eisenmenger, J
Schiessling, J
Bolz, U
Runge, BU
Leiderer, P
Lorenz, M
Hochmuth, H
Wallenhorst, M
Dotsch, H
Citation: J. Eisenmenger et al., Nondestructive magneto-optical characterization of natural and artificial defects on 3 '' HTSC wafers at liquid nitrogen temperature, IEEE APPL S, 9(2), 1999, pp. 1840-1843
Authors:
Kuhn, M
Schey, B
Biegel, W
Stritzker, B
Eisenmenger, J
Leiderer, P
Heismann, B
Kramer, HP
Neumuller, HW
Citation: M. Kuhn et al., Defect visualization in large area YBCO thin films by magneto-optical scanning technique, IEEE APPL S, 9(2), 1999, pp. 1844-1847