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Results:
1-8
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Results: 8
Authors:
Horii, S
Akimoto, K
Ito, S
Emoto, T
Ichimiya, A
Tajiri, H
Yashiro, W
Nakatani, S
Takahashi, T
Sugiyama, H
Zhang, X
Kawata, H
Citation: S. Horii et al., Interface reconstructed structure of Ag/Si(111) revealed by X-ray diffraction, SURF SCI, 493(1-3), 2001, pp. 194-199
Authors:
Emoto, T
Akimoto, K
Ishikawa, Y
Ichimiya, A
Citation: T. Emoto et al., Quantitative evaluation of strain near reconstructed Si surfaces, SURF SCI, 493(1-3), 2001, pp. 221-226
Authors:
Aoki, K
Sakoda, T
Hashimoto, S
Fukuda, Y
Handa, O
Emoto, T
Citation: K. Aoki et al., Formation of PZT thin-film capacitors over W-plugs and low-voltage operation for high-density LSIs, ELEC C JP 2, 83(8), 2000, pp. 1-7
Authors:
Emoto, T
Akimoto, K
Ishikawa, Y
Ichimiya, A
Tanikawa, A
Citation: T. Emoto et al., Strain near SiO2-Si interface revealed by X-ray diffraction intensity enhancement, THIN SOL FI, 369(1-2), 2000, pp. 281-284
Authors:
Emoto, T
Kubosaki, N
Yamagiwa, Y
Kamikawa, T
Citation: T. Emoto et al., A new route to phenazines, TETRAHEDR L, 41(3), 2000, pp. 355-358
Authors:
Nishihata, Y
Emura, S
Maeda, H
Kubozono, Y
Harada, M
Uruga, T
Tanida, H
Yoneda, Y
Mizuki, J
Emoto, T
Citation: Y. Nishihata et al., XAFS spectra in the high-energy region measured at SPring-8, J SYNCHROTR, 6, 1999, pp. 149-151
Authors:
Akimoto, K
Emoto, T
Ishikawa, Y
Ichimiya, A
Citation: K. Akimoto et al., Surface and interface strains revealed by X-ray diffraction, SURF REV L, 6(6), 1999, pp. 963-966
Authors:
Emoto, T
Akimoto, K
Ichimiya, A
Citation: T. Emoto et al., Strain field observed at the SiO2/Si(111) interface, SURF SCI, 438(1-3), 1999, pp. 107-115
Risultati:
1-8
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