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Citation: M. Regis et al., Noise behavior in SiGe devices, SOL ST ELEC, 45(11), 2001, pp. 1891-1897

Authors: Escotte, L Tartarin, JG Graffeuil, J

Citation: L. Escotte et al., A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set, IEEE INSTR, 48(4), 1999, pp. 830-834