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Results:
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Results: 2
Analyzing and characterizing 193nm resist shrinkage
Authors:
Su, B Eytan, G Padmanaban, M Romano, A
Citation:
B. Su et al., Analyzing and characterizing 193nm resist shrinkage, SOL ST TECH, 44(5), 2001, pp. 52
A storage Dewar near-field scanning optical microscope
Authors:
Eytan, G Yayon, Y Bar-Joseph, I Rappaport, ML
Citation:
G. Eytan et al., A storage Dewar near-field scanning optical microscope, ULTRAMICROS, 83(1-2), 2000, pp. 25-31
Risultati:
1-2
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