Authors:
Catalano, LW
Browne, RH
Carter, PR
Frobish, AC
Ezaki, M
Littler, JW
Citation: Lw. Catalano et al., The Littler line method and the area under a Gaussian curve: A new method of assessing digital range of motion, J HAND S-AM, 26A(1), 2001, pp. 23-30
Authors:
Tsuboi, S
Watanabe, H
Ezaki, M
Aoyama, H
Kikuchi, Y
Nakayama, Y
Ohki, S
Watanabe, T
Morosawa, T
Saito, K
Oda, M
Matsuda, T
Citation: S. Tsuboi et al., Precise delineation characteristics of advanced electron beam mask writer EB-X3 for fabricating 1x X-ray masks, JPN J A P 1, 39(12B), 2000, pp. 6902-6907
Authors:
Ezaki, M
Nakayama, Y
Kikuchi, Y
Tsuboi, S
Watanabe, H
Aoyama, H
Matsui, Y
Morosawa, T
Ohki, S
Saito, K
Matsuda, T
Citation: M. Ezaki et al., Critical-dimension controllability of chemically amplified resists for X-ray membrane mask fabrication, JPN J A P 1, 39(12B), 2000, pp. 6908-6913