Authors:
Lewis, A
Shambrot, E
Radko, A
Lieberman, K
Ezekiel, S
Veinger, D
Yampolski, G
Citation: A. Lewis et al., Failure analysis of integrated circuits beyond the diffraction limit: Contact mode near-field scanning optical microscopy with integrated resistance,capacitance, and UV confocal imaging, P IEEE, 88(9), 2000, pp. 1471-1479
Authors:
Elvin, N
Leung, CKY
Sudarshanam, VS
Ezekiel, S
Citation: N. Elvin et al., A novel fiber optic delamination detection scheme: Theoretical and experimental feasibility studies, J IN MAT SY, 10(4), 1999, pp. 314-321