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Authors: PRIOLO F BENYAICH F CAMPISANO SU RIMINI E SPINELLA C CACCIATO A WARD P FALLICO G
Citation: F. Priolo et al., INTERFACE EVOLUTION AND EPITAXIAL REALIGNMENT IN POLYCRYSTAL SINGLE-CRYSTAL SI STRUCTURES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 159-166

Authors: CACCIATO A BENYAICH F SPINELLA C RIMINI E FALLICO G WARD P
Citation: A. Cacciato et al., STRUCTURAL AND ELECTRICAL STUDY OF EPITAXIALLY REALIGNED SB-DOPED POLYCRYSTALLINE SI FILMS, Materials science & engineering. B, Solid-state materials for advanced technology, 18(3), 1993, pp. 289-294

Authors: SPINELLA C BENYAICH F CACCIATO A RIMINI E FALLICO G WARD P
Citation: C. Spinella et al., ROLE OF GRAIN-BOUNDARIES IN THE EPITAXIAL REALIGNMENT OF UNDOPED AND AS-DOPED POLYCRYSTALLINE SILICON FILMS, Journal of materials research, 8(10), 1993, pp. 2608-2612

Authors: BENYAICH F RIMINI E SPINELLA C CACCIATO A FALLICO G FERLA G WARD P
Citation: F. Benyaich et al., SIZE EFFECTS IN THE EPITAXIAL REALIGNMENT OF POLYCRYSTALLINE SILICON FILMS ONTO SI SUBSTRATES, Applied physics letters, 62(16), 1993, pp. 1895-1897
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