Authors:
PRIOLO F
BENYAICH F
CAMPISANO SU
RIMINI E
SPINELLA C
CACCIATO A
WARD P
FALLICO G
Citation: F. Priolo et al., INTERFACE EVOLUTION AND EPITAXIAL REALIGNMENT IN POLYCRYSTAL SINGLE-CRYSTAL SI STRUCTURES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 159-166
Authors:
CACCIATO A
BENYAICH F
SPINELLA C
RIMINI E
FALLICO G
WARD P
Citation: A. Cacciato et al., STRUCTURAL AND ELECTRICAL STUDY OF EPITAXIALLY REALIGNED SB-DOPED POLYCRYSTALLINE SI FILMS, Materials science & engineering. B, Solid-state materials for advanced technology, 18(3), 1993, pp. 289-294
Authors:
SPINELLA C
BENYAICH F
CACCIATO A
RIMINI E
FALLICO G
WARD P
Citation: C. Spinella et al., ROLE OF GRAIN-BOUNDARIES IN THE EPITAXIAL REALIGNMENT OF UNDOPED AND AS-DOPED POLYCRYSTALLINE SILICON FILMS, Journal of materials research, 8(10), 1993, pp. 2608-2612
Authors:
BENYAICH F
RIMINI E
SPINELLA C
CACCIATO A
FALLICO G
FERLA G
WARD P
Citation: F. Benyaich et al., SIZE EFFECTS IN THE EPITAXIAL REALIGNMENT OF POLYCRYSTALLINE SILICON FILMS ONTO SI SUBSTRATES, Applied physics letters, 62(16), 1993, pp. 1895-1897