AAAAAA
Results: 26-33/33
Authors:
KING PD
SANDBERG ET
SELVAKUMAR A
FANG P
BEAUDET AL
DUPONT B
Citation: Pd. King et al., NOVEL ISOFORMS OF MURINE INTERCELLULAR-ADHESION MOLECULE-1 GENERATED BY ALTERNATIVE RNA SPLICING, The Journal of immunology, 154(11), 1995, pp. 6080-6093
Authors:
FANG H
FANG P
YUE JT
Citation: H. Fang et al., HOT-CARRIER-INDUCED OFF-STATE CURRENT LEAKAGE IN SUBMICROMETER PMOSFET DEVICES, IEEE electron device letters, 15(11), 1994, pp. 463-465
Authors:
LIN MR
FANG P
HEILER F
LEE R
RAKKHIT R
SHEN L
Citation: Mr. Lin et al., CHARACTERIZATION AND OPTIMIZATION OF METAL ETCH PROCESSES TO MINIMIZECHARGING DAMAGE TO SUBMICRON TRANSISTOR GATE OXIDE, IEEE electron device letters, 15(1), 1994, pp. 25-27
Authors:
HUDNUT KW
BOCK Y
CLINE M
FANG P
FENG Y
FREYMUELLER J
GE X
GROSS WK
JACKSON D
KIM M
KING NE
LANGBEIN J
LARSEN SC
LISOWSKI M
SHEN ZK
SVARC J
ZHANG J
Citation: Kw. Hudnut et al., COSEISMIC DISPLACEMENTS OF THE 1992 LANDERS EARTHQUAKE SEQUENCE, Bulletin of the Seismological Society of America, 84(3), 1994, pp. 625-645
Authors:
SHEN ZK
JACKSON DD
FENG YJ
CLINE M
KIM M
FANG P
BOCK Y
Citation: Zk. Shen et al., POSTSEISMIC DEFORMATION FOLLOWING THE LANDERS EARTHQUAKE, CALIFORNIA,28 JUNE 1992, Bulletin of the Seismological Society of America, 84(3), 1994, pp. 780-791
Authors:
QUADER KN
FANG P
YUE JT
KO PK
HU CM
Citation: Kn. Quader et al., HOT-CARRIER-RELIABILITY DESIGN RULES FOR TRANSLATING DEVICE DEGRADATION TO CMOS DIGITAL CIRCUIT DEGRADATION, I.E.E.E. transactions on electron devices, 41(5), 1994, pp. 681-691
Authors:
KING PD
SANDBERG ET
SELVAKUMAR A
FANG P
BEAUDET AL
DUPONT B
Citation: Pd. King et al., TISSUE DISTRIBUTION AND FUNCTION OF NOVEL ISOFORMS OF MURINE ICAM-1 GENERATED BY ALTERNATIVE RNA SPLICING, Blood, 84(10), 1994, pp. 10000228-10000228
Authors:
FANG P
RAKKHIT R
YUE JT
Citation: P. Fang et al., AN INVESTIGATION OF HOT-CARRIER EFFECTS IN SUBMICRON CMOS INTEGRATED-CIRCUITS, Microelectronics and reliability, 33(11-12), 1993, pp. 1713-1727