Authors:
FIRON M
HUGON MC
AGIUS B
HU YZ
WANG Y
IRENE EA
Citation: M. Firon et al., COMPARISON OF THE PHYSICAL AND ELECTRICAL-PROPERTIES OF ELECTRON-CYCLOTRON-RESONANCE AND DISTRIBUTED ELECTRON-CYCLOTRON-RESONANCE SIO2, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 2543-2549
Citation: M. Firon et al., CHARACTERIZATION OF SILICON OXYNITRIDE THIN-FILMS BY INFRARED REFLECTION-ABSORPTION SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(4), 1996, pp. 2488-2492
Citation: R. Ossikovski et al., INFRARED ELLIPSOMETRY STUDY OF THE THICKNESS-DEPENDENT VIBRATION FREQUENCY-SHIFTS IN SILICON DIOXIDE FILMS, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(8), 1995, pp. 1797-1804
Authors:
ESHEL R
FIRON M
KATZ BZ
SAGIASSIF O
AVIRAM H
WITZ IP
Citation: R. Eshel et al., MICROENVIRONMENTAL FACTORS REGULATE LY-6 A E EXPRESSION ON PYV-TRANSFORMED BALB/C 3T3 CELLS/, Immunology letters, 44(2-3), 1995, pp. 209-212
Authors:
OSSIKOVSKI R
BLAYOI N
DREVILLON B
FIRON M
DELAHAYE B
MAYEUX A
Citation: R. Ossikovski et al., DETERMINATION OF THE COMPOSITION AND THICKNESS OF BOROPHOSPHOSILICATEGLASS-FILMS BY INFRARED ELLIPSOMETRY, Applied physics letters, 65(10), 1994, pp. 1236-1238