Authors: FLEMING JG ROHERTYOSMUN E SMITH PM CUSTER JS KIM YD KACSICH T NICOLET MA GALEWSKI CJ

Citation: Jg. Fleming et al., GROWTH AND PROPERTIES OF W-SI-N DIFFUSION-BARRIERS DEPOSITED BY CHEMICAL-VAPOR-DEPOSITION, Thin solid films, 320(1), 1998, pp. 10-14

Authors: LIN SY FLEMING JG HETHERINGTON DL SMITH BK BISWAS R HO KM SIGALAS MM ZUBRZYCKI W KURTZ SR BUR J

Citation: Sy. Lin et al., A 3-DIMENSIONAL PHOTONIC CRYSTAL OPERATING AT INFRARED WAVELENGTHS, Nature, 394(6690), 1998, pp. 251-253

Authors: FLEMING JG OHLBERG DAA FELTER T MALINOWSKI M

Citation: Jg. Fleming et al., FABRICATION AND TESTING OF VERTICAL METAL EDGE EMITTERS WITH WELL-DEFINED GATE TO EMITTER SEPARATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1958-1962

Authors: CHEEK RW KELBER JA FLEMING JG BLEWER RS LUJAN RD

Citation: Rw. Cheek et al., IN-SITU MONITORING OF THE PRODUCTS FROM THE SIH4-VAPOR-DEPOSITION PROCESS BY MICROVOLUME MOSS SPECTROMETRY(WF6 TUNGSTEN CHEMICAL), Journal of the Electrochemical Society, 140(12), 1993, pp. 3588-3590