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LOW-TEMPERATURE ADMITTANCE MEASUREMENT IN THIN-FILM AMORPHOUS-SILICONSTRUCTURES
Authors:
CAPUTO D FORGHIERI U PALMA F
Citation:
D. Caputo et al., LOW-TEMPERATURE ADMITTANCE MEASUREMENT IN THIN-FILM AMORPHOUS-SILICONSTRUCTURES, Journal of applied physics, 82(2), 1997, pp. 733-741
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