Authors: DIETRICH B BUGIEL E FRANKENFELDT H HARKER AH JAGDHOLD U TILLACK B WOLFF A

Citation: B. Dietrich et al., STRAIN-MEASUREMENT IN THIN PSEUDOMORPHIC SIGE LAYERS OF SUBMICRON WIRES USING RAMAN-SPECTROSCOPY, Solid-state electronics, 40(1-8), 1996, pp. 307-310