Authors: FRANKOVIC R SNIDER GL BERNSTEIN GH

Citation: R. Frankovic et al., A NOVEL MICROMACHINING TECHNIQUE FOR THE FORMATION OF EXTRUSIONS, IEEE electron device letters, 18(4), 1997, pp. 135-137

Authors: FRANKOVIC R BERNSTEIN GH

Citation: R. Frankovic et Gh. Bernstein, TEMPERATURE-DEPENDENCE OF ELECTROMIGRATION THRESHOLD IN CU, Journal of applied physics, 81(3), 1997, pp. 1604-1605

Authors: FRANKOVIC R BERNSTEIN GH CLEMENT JJ

Citation: R. Frankovic et al., PULSED-CURRENT DUTY CYCLE DEPENDENCE OF ELECTROMIGRATION-INDUCED STRESS GENERATION IN ALUMINUM CONDUCTORS, IEEE electron device letters, 17(5), 1996, pp. 244-246

Authors: FRANKOVIC R BERNSTEIN GH

Citation: R. Frankovic et Gh. Bernstein, ELECTROMIGRATION DRIFT AND THRESHOLD IN CU THIN-FILM INTERCONNECTS, I.E.E.E. transactions on electron devices, 43(12), 1996, pp. 2233-2239