Authors: MEIER GD FRESSER HS PRINS FE KERN DP

Citation: Gd. Meier et al., CHARACTERIZATION AND APPLICATION OF A LOW-PROFILE METAL-SEMICONDUCTOR-METAL DETECTOR FOR LOW-ENERGY BACKSCATTERED ELECTRONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3821-3824

Authors: FRESSER HS PRINS FE KERN DP

Citation: Hs. Fresser et al., LOW-ENERGY-ELECTRON DETECTION IN MICROCOLUMNS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2553-2555

Authors: FRESSER HS PRINS FE KERN DP

Citation: Hs. Fresser et al., METAL-SEMICONDUCTOR-METAL STRUCTURES AS ELECTRON DETECTOR FOR 1 KV MICROCOLUMNS, Microelectronic engineering, 27(1-4), 1995, pp. 159-162