Authors: FRIEDE B JANSEN R

Citation: B. Friede et R. Jansen, IN-SITU HIGH-PRESSURE AND HIGH-TEMPERATUR E STUDIES OF SILICON SUBOXIDES VIA ENERGY-DISPERSIVE X-RAY-DIFFRACTION, Zeitschrift fur anorganische und allgemeine Chemie, 624(7), 1998, pp. 1159-1165

Authors: HAGENMAYER RM FRIEDE B JANSEN M

Citation: Rm. Hagenmayer et al., STRUCTURAL STUDIES ON AMORPHOUS SI2O3 AND H2SI2O4 BY MEANS OF DIFFRACTION USING HIGH-ENERGY PHOTONS, Journal of non-crystalline solids, 226(3), 1998, pp. 225-231

Authors: JANSEN M FRIEDE B

Citation: M. Jansen et B. Friede, HEXAIODODISILANE, Acta crystallographica. Section C, Crystal structure communications, 52, 1996, pp. 1333-1334

Authors: FRIEDE B JANSEN M

Citation: B. Friede et M. Jansen, SOME COMMENTS ON SO-CALLED SILICON MONOXIDE, Journal of non-crystalline solids, 204(2), 1996, pp. 202-203