Authors:
ZIETHEN C
SCHMIDT O
FECHER GH
SCHNEIDER CM
SCHONHENSE G
FROMTER R
SEIDER M
GRZELAKOWSKI K
MERKEL M
FUNNEMANN D
SWIECH W
GUNDLACH H
KIRSCHNER J
Citation: C. Ziethen et al., FAST ELEMENTAL MAPPING AND MAGNETIC IMAGING WITH HIGH LATERAL RESOLUTION USING A NOVEL PHOTOEMISSION MICROSCOPE, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 983-989
Authors:
SWIECH W
FECHER GH
ZIETHEN C
SCHMIDT O
SCHONHENSE G
GRZELAKOWSKI K
SCHNEIDER CM
FROMTER R
OEPEN HP
KIRSCHNER J
Citation: W. Swiech et al., RECENT PROGRESS IN PHOTOEMISSION MICROSCOPY WITH EMPHASIS ON CHEMICALAND MAGNETIC SENSITIVITY, Journal of electron spectroscopy and related phenomena, 84(1-3), 1997, pp. 171-188
Authors:
SCHNEIDER CM
FROMTER R
SWIECH W
ZIETHEN C
SCHMIDT O
FECHER GH
SCHONHENSE G
KIRSCHNER J
Citation: Cm. Schneider et al., MAGNETIC SPECTROMICROSCOPY AND MICROSPECTROSCOPY WITH SUBMICROMETER RESOLUTION, Journal of applied physics, 81(8), 1997, pp. 5020-5020