Authors:
GOHDE W
FISCHER UC
FUCHS H
TITTEL J
BASCHE T
BRAUCHLE C
HERRMANN A
MULLEN K
Citation: W. Gohde et al., FLUORESCENCE BLINKING AND PHOTOBLEACHING OF SINGLE TERRYLENEDIIMIDE MOLECULES STUDIED WITH A CONFOCAL MICROSCOPE, The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory, 102(46), 1998, pp. 9109-9116
Authors:
FUCHS H
LUCKEN U
TAUBER R
ENGEL A
GESSNER R
Citation: H. Fuchs et al., STRUCTURAL MODEL OF PHOSPHOLIPID-RECONSTITUTED HUMAN TRANSFERRIN RECEPTOR DERIVED BY ELECTRON-MICROSCOPY, Structure, 6(10), 1998, pp. 1235-1243
Authors:
ANCZYKOWSKI B
CLEVELAND JP
KRUGER D
ELINGS V
FUCHS H
Citation: B. Anczykowski et al., ANALYSIS OF THE INTERACTION MECHANISMS IN DYNAMIC-MODE SFM BY MEANS OF EXPERIMENTAL-DATA AND COMPUTER-SIMULATION, Applied physics A: Materials science & processing, 66, 1998, pp. 885-889
Authors:
FLORSHEIMER M
PASCHOTTA R
KUBITSCHECK U
BRILLERT C
HOFMANN D
HEUER L
SCHREIBER G
VERBEEK C
SOHLER W
FUCHS H
Citation: M. Florsheimer et al., 2ND-HARMONIC IMAGING OF FERROELECTRIC DOMAINS IN LINBO3 WITH MICRON RESOLUTION IN LATERAL AND AXIAL DIRECTIONS, Applied physics. B, Lasers and optics, 67(5), 1998, pp. 593-599
Citation: Lf. Chi et al., STUDY OF LONG-RANGE TILT ORIENTATION IN FATTY-ACID MONOLAYERS BY DYNAMIC SCANNING FORCE MICROSCOPY, Langmuir, 14(4), 1998, pp. 875-879
Authors:
RADING D
LIEBING V
BECKER G
FUCHS H
BENNINGHOVEN A
Citation: D. Rading et al., INVESTIGATION OF ELECTRON-INDUCED DAMAGING OF MOLECULAR OVERLAYERS BYIMAGING STATIC SECONDARY-ION MASS-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(6), 1998, pp. 3449-3454
Authors:
LEDOUX X
BOHLEN HG
CUGNON J
FUCHS H
GALIN J
GATTY B
GEBAUER B
GUERREAU D
HILSCHER D
JACQUET D
JAHNKE U
JOSSET M
LERAY S
LOTT B
MORJEAN M
QUEDNAU BM
ROSCHERT G
ROSSNER H
PEGHAIRE A
PIENKOWSKI L
SIEMSSEN RH
STEPHAN C
Citation: X. Ledoux et al., FORMATION AND DECAY OF HOT NUCLEI IN 475 MEV, 2 GEV PROTON-INDUCED AND 2 GEV HE-3-INDUCED REACTIONS ON AG, BI, AN, AND U, Physical review. C. Nuclear physics, 57(5), 1998, pp. 2375-2392
Authors:
TERNG HJ
GESSNER R
FUCHS H
STAHL U
LANG C
Citation: Hj. Terng et al., HUMAN TRANSFERRIN RECEPTOR IS ACTIVE AND PLASMA MEMBRANE-TARGETED IN YEAST, FEMS microbiology letters, 160(1), 1998, pp. 61-67
Authors:
WIESMANN HP
CHI LF
STRATMANN U
PLATE U
FUCHS H
JOOS U
HOHLING HJ
Citation: Hp. Wiesmann et al., SUTURAL MINERALIZATION OF RAT CALVARIA CHARACTERIZED BY ATOMIC-FORCE MICROSCOPY AND TRANSMISSION ELECTRON-MICROSCOPY, Cell and tissue research, 294(1), 1998, pp. 93-97
Authors:
LYNCH DE
PETERSON IR
FLOERSHEIMER M
ESSING D
CHI LF
FUCHS H
CALOS NJ
WOOD B
KENNARD CHL
LANGLEY GJ
Citation: De. Lynch et al., SYNTHESIS AND NONLINEAR-OPTICAL PROPERTIES OF (N-ALKYLPYRROL-2-YL)SQUARAINE DERIVATIVES - PART-2, Perkin transactions. 2, (4), 1998, pp. 779-784
Citation: Hh. Donaubauer et al., SUBCHRONIC INTRAVENOUS TOXICITY STUDIES WITH GAMMA-CYCLODEXTRIN IN RATS, Regulatory toxicology and pharmacology, 27(2), 1998, pp. 189-198
Citation: H. Fuchs et al., DISTRIBUTION OF ION CURRENT-DENSITY IN A MODIFIED PULSE ARC PROCESS AS A FUNCTION OF PULSE PARAMETERS, Surface & coatings technology, 98(1-3), 1998, pp. 839-844
Citation: H. Fuchs et al., APPLICATION OF MOLECULAR-GENETIC MARKERS FOR THE DIFFERENTIATION OF BREAM (ABRAMIS-BRAMA L.) POPULATIONS FROM THE RIVERS MAIN AND DANUBE, Journal of applied ichthyology, 14(1-2), 1998, pp. 49-55
Citation: T. Drechsler et al., A LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY INVESTIGATION OF SINGLE-ELECTRON EFFECTS, Scanning, 20(4), 1998, pp. 297-301
Authors:
SINCLAIR VG
WALLSTON KA
DWYER KA
BLACKBURN DS
FUCHS H
Citation: Vg. Sinclair et al., EFFECTS OF A COGNITIVE-BEHAVIORAL INTERVENTION FOR WOMEN WITH RHEUMATOID-ARTHRITIS, Research in nursing & health, 21(4), 1998, pp. 315-326
Authors:
SEIDEL C
GOTSMANN B
KOPF H
REIHS K
FUCHS H
Citation: C. Seidel et al., ALUMINUM DEPOSITION ON SF6 PLASMA-TREATED POLYCARBONATE - AN AFM, XPSAND MASS-SPECTROSCOPY STUDY, Surface and interface analysis, 26(4), 1998, pp. 306-315
Citation: M. Hartig et al., DEPENDENCE OF THE MEASURED MONOLAYER HEIGHT ON APPLIED FORCES IN SCANNING FORCE MICROSCOPY, Thin solid films, 329, 1998, pp. 262-267