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Results: 1-10 |
Results: 10
An introduction to deep submicron CMOS for vertex applications
Authors: Campbell, M Anelli, G Cantatore, E Faccio, F Heijne, EHM Jarron, P Santiard, JC Snoeys, W Wyllie, K
Citation: M. Campbell et al., An introduction to deep submicron CMOS for vertex applications, NUCL INST A, 473(1-2), 2001, pp. 140-145
Noise characterization of a 0.25 mu m CMOS technology for the LHC experiments
Authors: Anelli, G Faccio, F Florian, S Jarron, P
Citation: G. Anelli et al., Noise characterization of a 0.25 mu m CMOS technology for the LHC experiments, NUCL INST A, 457(1-2), 2001, pp. 361-368
Single event upset tests of an 80-Mb/s optical receiver
Authors: Faccio, F Berger, G Gill, K Huhtinen, M Marchioro, A Moreira, P Vasey, F
Citation: F. Faccio et al., Single event upset tests of an 80-Mb/s optical receiver, IEEE NUCL S, 48(5), 2001, pp. 1700-1707
Computational method to estimate Single Event Upset rates in an accelerator environment
Authors: Huhtinen, M Faccio, F
Citation: M. Huhtinen et F. Faccio, Computational method to estimate Single Event Upset rates in an accelerator environment, NUCL INST A, 450(1), 2000, pp. 155-172
Layout techniques to enhance the radiation tolerance of standard CMOS technologies demonstrated on a pixel detector readout chip
Authors: Snoeys, W Faccio, F Burns, M Campbell, M Cantatore, E Carrer, N Casagrande, L Cavagnoli, A Dachs, C Di Liberto, S Formenti, F Giraldo, A Heijne, EHM Jarron, P Letheren, M Marchioro, A Martinengo, P Meddi, F Mikulec, B Morando, M Morel, M Noah, E Paccagnella, A Ropotar, I Saladino, S Sansen, W Santopietro, F Scarlassara, F Segato, GF Signe, PM Soramel, F Vannucci, L Vleugels, K
Citation: W. Snoeys et al., Layout techniques to enhance the radiation tolerance of standard CMOS technologies demonstrated on a pixel detector readout chip, NUCL INST A, 439(2-3), 2000, pp. 349-360
Integrated circuits for particle physics experiments
Authors: Snoeys, W Anelli, G Campbell, M Cantatore, E Faccio, F Heijne, EHM Jarron, P Kloukinas, KC Marchioro, A Moreira, P Toifl, T Wyllie, K
Citation: W. Snoeys et al., Integrated circuits for particle physics experiments, IEEE J SOLI, 35(12), 2000, pp. 2018-2030
Deep submicron CMOS technologies for the LHC experiments
Authors: Jarron, P Anelli, G Calin, T Cosculluela, J Campbell, B Delmastro, M Faccio, F Giraldo, A Heijne, E Kloukinas, K Letheren, M Nicolaidis, M Moreira, P Paccagnella, A Marchioro, A Snoeys, W Velazco, R
Citation: P. Jarron et al., Deep submicron CMOS technologies for the LHC experiments, NUCL PH B-P, 78, 1999, pp. 625-634
Single event effects in static and dynamic registers in a 0.25 mu m CMOS technology
Authors: Faccio, F Kloukinas, K Marchioro, A Calin, T Cosculluela, J Nicolaidis, M Velazco, R
Citation: F. Faccio et al., Single event effects in static and dynamic registers in a 0.25 mu m CMOS technology, IEEE NUCL S, 46(6), 1999, pp. 1434-1439
Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: Practical design aspects
Authors: Anelli, G Campbell, M Delmastro, M Faccio, F Florian, S Giraldo, A Heijne, E Jarron, P Kloukinas, K Marchioro, A Moreira, P Snoeys, W
Citation: G. Anelli et al., Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: Practical design aspects, IEEE NUCL S, 46(6), 1999, pp. 1690-1696
A pixel readout chip for 10-30 MRad in standard 0.25 mu m CMOS
Authors: Campbell, M Anelli, G Burns, M Cantatore, E Casagrande, L Delmastro, M Dinapoli, R Faccio, F Heijne, E Jarron, P Luptak, M Marchioro, A Martinengo, P Minervini, D Morel, M Pernigotti, E Ropotar, I Snoeys, W Wyllie, K
Citation: M. Campbell et al., A pixel readout chip for 10-30 MRad in standard 0.25 mu m CMOS, IEEE NUCL S, 46(3), 1999, pp. 156-160
Risultati: 1-10 |