Authors:
Sekioka, T
Terasawa, M
Mitamura, T
Stockli, MP
Lehnert, U
Fehrenbach, C
Citation: T. Sekioka et al., Electronic excitation effects on secondary ion emission in highly charged ion-solid interaction, NUCL INST B, 182, 2001, pp. 121-126
Authors:
Mroz, W
Prokopiuk, A
Kozlov, B
Czujko, T
Jozwiak, S
Krzywinski, J
Stockli, MP
Fehrenbach, C
Citation: W. Mroz et al., Quantitative measurements of the chemical composition of unprepared samples, using a reflectron mass analyzer with a microchannelplate detector assembly, REV SCI INS, 71(3), 2000, pp. 1425-1428
Authors:
Stockli, MP
Carnes, K
Cocke, CL
DePaola, BD
Ehrenreich, T
Fehrenbach, C
Fry, D
Gibson, PE
Kelly, S
Lehnert, U
Needham, V
Reiser, I
Richard, P
Tipping, TN
Walch, B
Cuquemelle, A
Doudna, C
Eastman, B
Kentsch, U
Schedler, R
Kobayashi, N
Matsumoto, J
Madzunkov, S
Citation: Mp. Stockli et al., New improvements on the Kansas State University cryogenic electron beam ion source, a user facility for low energy, highly charged ions, REV SCI INS, 71(2), 2000, pp. 902-905