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Citation: Ng. Ferreira et al., Stress study of HFCVD boron-doped diamond films by X-ray diffraction measurements, DIAM RELAT, 10(3-7), 2001, pp. 750-754

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Authors: Ferreira, NG Corat, EJ Trava-Airoldi, VJ Leite, NF

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Authors: Ferreira, NG Silva, LLG Corat, EJ Trava-Airoldi, VJ Iha, K

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